What do we know about the defect types detected in conceptual models?

Maria Fernanda Granda, Nelly Condori-Fernandez, Tanja E.J. Vos, Oscar Pastor

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

19 Citas (Scopus)

Resumen

In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.

Idioma originalInglés
Título de la publicación alojadaIEEE RCIS 2015 - 9th International Conference on Research Challenges in Information Science, Proceedings
EditoresColette Rolland, Dimosthenis Anagnostopoulos, Pericles Loucopoulos, Cesar Gonzales-Perez
EditorialIEEE Computer Society
Páginas88-99
Número de páginas12
EdiciónJune
ISBN (versión digital)9781467366304
DOI
EstadoPublicada - 19 jun. 2015
Evento9th IEEE International Conference on Research Challenges in Information Science, IEEE RCIS 2015 - Athens, Grecia
Duración: 13 may. 201515 may. 2015

Serie de la publicación

NombreProceedings - International Conference on Research Challenges in Information Science
NúmeroJune
Volumen2015-June
ISSN (versión impresa)2151-1349
ISSN (versión digital)2151-1357

Conferencia

Conferencia9th IEEE International Conference on Research Challenges in Information Science, IEEE RCIS 2015
País/TerritorioGrecia
CiudadAthens
Período13/05/1515/05/15

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