Towards the insulin resistance and obesity diagnosis: A dimensional analysis approach

Jesus Velasquez, Erika Severeyn, Hector Herrera, Nestor Utrera, Lorena Encalada, Sara Wong

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

Diabetes mellitus and cardiovascular diseases are ailments related to insulin resistance (IR) and obesity. The existing methods for IR and obesity diagnosis are the HOMA-IR and body mass index (BMI), respectively. Those methods have limitations in the diagnosis. The aim of this research is to propose dimensionless indexes that can diagnose subjects with IR and obesity using anthropometrics and biochemical variables (waist circumference, height, weight, systolic blood pressure, diastolic blood pressure and triglycerides). Three dimensionless indexes, designed from the π Vaschy-Buckingham theorem, were assessed using receiver operating characteristic (ROC) curves and a database of 829 subjects. The index π 1 , constructed with the variables: waist circumference, triglycerides height and weight; obtained a better performance as classifier of IR and obesity, presenting an area under the ROC curve of 0.78, sensitivity of 0.82 and specificity of 0.68 for IR diagnosis, and an area under the ROC curve of 0.68, sensitivity of 0.66 and specificity of 0.65 for obesity diagnosis. The π 1 dimensionless index designed in this study is a simple method that allows diagnosing two pathologies from variables that can be collected in a routine medical examination.

Idioma originalInglés
Título de la publicación alojada2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781538666579
DOI
EstadoPublicada - 17 dic. 2018
Evento3rd IEEE Ecuador Technical Chapters Meeting, ETCM 2018 - Cuenca, Ecuador
Duración: 15 oct. 201819 oct. 2018

Serie de la publicación

Nombre2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018

Conferencia

Conferencia3rd IEEE Ecuador Technical Chapters Meeting, ETCM 2018
País/TerritorioEcuador
CiudadCuenca
Período15/10/1819/10/18

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