Characterizing artifacts in RR stress test time series

Fabián Astudillo-Salinas, Kenneth Palacio-Baus, Lizandro Solano-Quinde, Rubén Medina, Sara Wong

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

2 Citas (Scopus)

Resumen

Electrocardiographic stress test records have a lot of artifacts. In this paper we explore a simple method to characterize the amount of artifacts present in unprocessed RR stress test time series. Four time series classes were defined: Very good lead, Good lead, Low quality lead and Useless lead. 65 ECG, 8 lead, records of stress test series were analyzed. Firstly, RR-time series were annotated by two experts. The automatic methodology is based on dividing the RR-time series in non-overlapping windows. Each window is marked as noisy whenever it exceeds an established standard deviation threshold (SDT). Series are classified according to the percentage of windows that exceeds a given value, based upon the first manual annotation. Different SDT were explored. Results show that SDT close to 20% (as a percentage of the mean) provides the best results. The coincidence between annotators classification is 70.77% whereas, the coincidence between the second annotator and the automatic method providing the best matches is larger than 63%. Leads classified as Very good leads and Good leads could be combined to improve automatic heartbeat labeling.

Idioma originalInglés
Título de la publicación alojada2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas692-695
Número de páginas4
ISBN (versión digital)9781457702204
DOI
EstadoPublicada - 13 oct. 2016
Evento38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016 - Orlando, Estados Unidos
Duración: 16 ago. 201620 ago. 2016

Serie de la publicación

NombreProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
Volumen2016-October
ISSN (versión impresa)1557-170X

Conferencia

Conferencia38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
País/TerritorioEstados Unidos
CiudadOrlando
Período16/08/1620/08/16

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