TY - GEN
T1 - A comparative study of black-box models for cement quality prediction using input-output measurements of a closed circuit grinding
AU - Minchala-Avila, Luis I.
AU - Reinoso-Avecillas, Manuel
AU - Sanchez, Christian
AU - Mora, Alfredo
AU - Yungaicela, Marcelo
AU - Mata-Quevedo, Jean P.
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/6/13
Y1 - 2016/6/13
N2 - This paper presents the methodology of design of three different modeling techniques for predicting cement quality using input-output measurements of the closed circuit grinding in a cement plant. The modeling approaches used are: statistical, artificial neural networks (ANN), and adaptive neuro-fuzzy inference systems (ANFIS). The data set for generating the predictive models are obtained from a database of the operation of the cement plant, UCEM-Guapan. An OPC (OLE for process control) network configuration in the SCADA system allows online validations of the proposed models in order to select the best approach for real-time prediction of cement quality.
AB - This paper presents the methodology of design of three different modeling techniques for predicting cement quality using input-output measurements of the closed circuit grinding in a cement plant. The modeling approaches used are: statistical, artificial neural networks (ANN), and adaptive neuro-fuzzy inference systems (ANFIS). The data set for generating the predictive models are obtained from a database of the operation of the cement plant, UCEM-Guapan. An OPC (OLE for process control) network configuration in the SCADA system allows online validations of the proposed models in order to select the best approach for real-time prediction of cement quality.
KW - adaptive neuro-fuzzy inference system
KW - artificial neural networks
KW - black-box model
KW - Fineness of the cement
UR - https://www.scopus.com/pages/publications/84979279823
U2 - 10.1109/SYSCON.2016.7490538
DO - 10.1109/SYSCON.2016.7490538
M3 - Contribución a la conferencia
AN - SCOPUS:84979279823
T3 - 10th Annual International Systems Conference, SysCon 2016 - Proceedings
BT - 10th Annual International Systems Conference, SysCon 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th Annual International Systems Conference, SysCon 2016
Y2 - 18 April 2016 through 21 April 2016
ER -