Fault Identification System for Photovoltaic Panels with Artificial Intelligence

Victor Mise, Edison Mosquera, Jacqueline Llanos, Ismael Minchala, Franklin Silva

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This research presents the design and simulation of a neural network-based fault identification system for a photovoltaic panel. The system allows detecting mismatch and degradation faults caused by humidity, which are equivalent to the increase or decrease of the internal series resistance of the panel respectively, thus preventing damages that could limit its performance and lifetime. Mismatch failures are caused by the occurrence of hot spots, while panel exposure in humid environments causes failures due to moisture degradation. A photovoltaic panel is modeled using the parameters provided by its manufacturer. A series resistance estimator based on the recursive least square's method with a forgetting factor and upper and lower confidence intervals is proposed. Fault identification is performed using a multilayer perceptron neural network with supervised training. Inputs to the network are irradiance and estimated series resistance value. Outputs are: normal operation, failure due to mismatch and failure due to moisture degradation. The estimator is evaluated for various scenarios, including normal and failures operation. In addition, it is subjected to different solar irradiance profiles based on real data. The estimator demonstrates good performance, correctly identifying all evaluated operating points.

Original languageEnglish
Title of host publicationECTM 2023 - 2023 IEEE 7th Ecuador Technical Chapters Meeting
EditorsDavid Rivas Lalaleo, Manuel Ignacio Ayala Chauvin
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350338232
DOIs
StatePublished - 2023
Externally publishedYes
Event7th IEEE Ecuador Technical Chapters Meeting, ECTM 2023 - Ambato, Ecuador
Duration: 10 Oct 202313 Oct 2023

Publication series

NameECTM 2023 - 2023 IEEE 7th Ecuador Technical Chapters Meeting

Conference

Conference7th IEEE Ecuador Technical Chapters Meeting, ECTM 2023
Country/TerritoryEcuador
CityAmbato
Period10/10/2313/10/23

Keywords

  • neural networks
  • Panel failures
  • photovoltaic panel
  • recursive least squares with forgetting factor

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