Characterizing artifacts in RR stress test time series

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Electrocardiographic stress test records have a lot of artifacts. In this paper we explore a simple method to characterize the amount of artifacts present in unprocessed RR stress test time series. Four time series classes were defined: Very good lead, Good lead, Low quality lead and Useless lead. 65 ECG, 8 lead, records of stress test series were analyzed. Firstly, RR-time series were annotated by two experts. The automatic methodology is based on dividing the RR-time series in non-overlapping windows. Each window is marked as noisy whenever it exceeds an established standard deviation threshold (SDT). Series are classified according to the percentage of windows that exceeds a given value, based upon the first manual annotation. Different SDT were explored. Results show that SDT close to 20% (as a percentage of the mean) provides the best results. The coincidence between annotators classification is 70.77% whereas, the coincidence between the second annotator and the automatic method providing the best matches is larger than 63%. Leads classified as Very good leads and Good leads could be combined to improve automatic heartbeat labeling.

Original languageEnglish
Title of host publication2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages692-695
Number of pages4
ISBN (Electronic)9781457702204
DOIs
StatePublished - 13 Oct 2016
Event38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016 - Orlando, United States
Duration: 16 Aug 201620 Aug 2016

Publication series

NameProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
Volume2016-October
ISSN (Print)1557-170X

Conference

Conference38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
Country/TerritoryUnited States
CityOrlando
Period16/08/1620/08/16

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