A Novel Electronic Chip Detection Method Using Deep Neural Networks

Electronic chip detection is widely used in electronic industries. However, most existing detection methods cannot handle chip images with multiple classes of chips or complex backgrounds, which are common in real applications. To address these problems, a novel chip detection method that combines attentional feature fusion (AFF) and cosine nonlocal attention (CNLA), is proposed, and it consists of three parts: a feature extraction module, a region proposal module, and a detection module. The feature extraction module combines an AFF-embedded CNLA module and a pyramid feature module to extract features from chip images. The detection module enhances feature maps with a region intermediate feature map by spatial attentional block, fuses multiple feature maps with a multiscale region of the fusion block of interest, and classifies and regresses objects in images with two branches of fully connected layers. Experimental results on a medium-scale dataset comprising 367 images show that our proposed method achieved mAP^0.5 = 0.98745 and outperformed the benchmark method.